Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676660 | Thin Solid Films | 2006 | 5 Pages |
Abstract
The structures of Co90Fe10/Cu multilayers were investigated by X-ray anomalous scattering techniques. It is found that the Cu/Co90Fe10 and Co90Fe10/Cu interfaces have different thermal behavior upon annealing. For the as-deposited sample, a Cu2Co intermixing region exists at the Cu/Co90Fe10 interface, while the Co90Fe10/Cu interface is sharp. There exists only a Co70Fe30 sublayer close to the interface in the Co90Fe10 layer. After annealing at 285 °C for 2 h, more Cu react with Co to create a Cu3Co intermixing region at the Cu/Co90Fe10 interface, while no obvious change is observed at the Co90Fe10/Cu interface. The X-ray diffuse scattering measurements performed with the incident X-ray energy close to Fe, Co and Cu K edges, respectively, revealed an island growth mechanism of the multilayers.
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Authors
Y.K. An, B. Dai, Z.H. Mai, J.W. Cai, Z.H. Wu,