Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676722 | Thin Solid Films | 2006 | 6 Pages |
Abstract
Vanadium pentoxide films were deposited onto glass substrates at different substrate temperatures (RT—400 °C) by d.c. reactive magnetron sputtering. The structural properties of the films were studied by X-ray diffraction, scanning electron microscopy and Raman spectra. The optical properties of the films were studied by measuring and fitting the transmittance. The film prepared at low temperature showed a high optical transmittance. The film prepared at the substrate temperature lower than 200 °C has an amorphous structure and the film prepared at substrate temperatures higher than 200 °C had a polycrystalline V2O5 structure. The optical parameters of the films were calculated by fitting the transmittance using the classical model.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Li-Jian Meng, Rui A. Silva, Hain-Ning Cui, Vasco Teixeira, M.P. dos Santos, Zheng Xu,