Article ID Journal Published Year Pages File Type
1676798 Thin Solid Films 2006 6 Pages PDF
Abstract
Mesoporous layers of silica are of interest for many optical applications, including the creation of devices ranging from optical sensors to laser sources with promising characteristics. Their optical characterization goes through the interpretation of measurements. We propose to give experimental results of reflectance and scattering measurements concerning mesoporous layers of silica deposited onto silicium substrates. This work shows that their interpretation in terms of optical indices or dielectric function have to be taken with care since scattering is present, and thereby the Kramers-Kronig relations appear not to be fulfilled.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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