Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676862 | Thin Solid Films | 2006 | 4 Pages |
Abstract
We studied the growth of strain relaxed Si1−yCy films on Si(001) substrates. The critical thickness of Si1−yCy on Si was calculated using People's equation. The strain relaxed Si1−yCy films on Si substrates were grown by gas source MBE (GS-MBE) and it was found from cross sectional TEM analysis that the use of Si buffer layers was very important in order to obtain high quality Si1−yCy films. Lattice relaxation was clearly observed when the thickness of the Si1−yCy layers exceeded their critical thickness. The relaxation ratio of Si1−yCy films with a carbon concentration of 1.0% was 40% in the vertical direction when the film thickness was 1800 nm.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Hanae Ishihara, Masahiko Murano, Tatsuro Watahiki, Akira Yamada, Makoto Konagai, Yoshio Nakamura,