Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1677042 | Thin Solid Films | 2006 | 4 Pages |
Abstract
In this study, two different types of internal linear antennas were compared and their characteristics were investigated for a large area ICPs applied to FPD processing. The measured plasma density for the double comb-type antenna was higher than 2 Ã 1011/cm3 and the etch rates of photoresist and SiO2 at 5000 W rf power, â 60 V of dc-bias voltage, and 15 mTorr SF6 were about 3000 Ã
/min and 1500 Ã
/min. The etch non-uniformity of the photoresist within the substrate was about 7% at 5000 W of rf power.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S.J. Jung, K.N. Kim, G.Y. Yeom,