Article ID Journal Published Year Pages File Type
1677476 Ultramicroscopy 2013 5 Pages PDF
Abstract

In this paper we report on a simple and robust method to measure the absolute temporal overlap of the laser and the electron beam at the sample based on the effect of a laser induced plasma on the electron beam transverse distribution, successfully extending a similar method from keV to MeV electron beams. By pumping a standard copper TEM grid to form the plasma, we gain timing information independent of the sample under study. In experiments discussed here the optical delay to achieve temporal overlap between the pump electron beam and probe laser can be determined with ∼1ps precision.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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