| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677498 | Ultramicroscopy | 2012 | 6 Pages |
Abstract
The evolution of LEEM and the later extension to spectroscopic PEEM, which run more or less parallel to Gertrude F. Rempfer's involvement in UV-PEEM and LEEM, are recounted with emphasis on instrumentation.
► LEEM for surface structure analysis. ► XPEEM for surface chemical, electronic and magnetic analysis. ► PEEM for studying biological samples.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Ernst Bauer,