| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677505 | Ultramicroscopy | 2012 | 9 Pages |
Abstract
⺠We have developed and tested a new method for including HOLZ effects in an efficient way in electron scattering simulations. ⺠The ICMS method has higher accuracy than the CMS method for the calculation of the ZOLZ, HOLZ and Pseudo-HOLZ reflections. ⺠ICMS method allows to use a larger slice thickness than the CMS method and reduces the calculation time.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
I. Lobato, D. Van Dyck,