| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677524 | Ultramicroscopy | 2013 | 10 Pages |
Abstract
⺠A method is developed to convert ADF-STEM images to 'thickness profile' images. ⺠It is applicable in particles survey, facets determination and discrete tomography. ⺠A method to calibrate the response of the ADF detector is described. ⺠The response in analysed across a range of conditions. ⺠Dynamical ADF image simulations are presented, demonstrating intensity vs. thickness dependence.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Hadas Katz-Boon, Chris J. Rossouw, Christian Dwyer, Joanne Etheridge,