| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677525 | Ultramicroscopy | 2013 | 6 Pages |
Abstract
⺠A new algorithm is developed to quantify symmetry recorded in CBED patterns. ⺠It allows a measurement of local symmetry and symmetry breaking caused by defects. ⺠The algorithm is combined with scanning electron diffraction for symmetry mapping.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Kyou-Hyun Kim, Jian-Min Zuo,