| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677528 | Ultramicroscopy | 2013 | 6 Pages |
Abstract
⺠The full tip has been imaged by atom probe tomography. ⺠The conductive substrate close to specimen tip introduces extra image compression. ⺠The apex of the tip is far from a hemispherical shape. ⺠This work demonstrates a way to increase the FOV of APT.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Sichao Du, Timothy Burgess, Shyeh Tjing Loi, Baptiste Gault, Qiang Gao, Peite Bao, Li Li, Xiangyuan Cui, Wai Kong Yeoh, Hark Hoe Tan, Chennupati Jagadish, Simon P. Ringer, Rongkun Zheng,