| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677557 | Ultramicroscopy | 2012 | 8 Pages |
Abstract
⺠HAADF image simulations were performed on AlAs/GaAs interfacial models. ⺠Perfect, vicinal/sawtooth and diffusion models were considered. ⺠Interfacial sharpness as a function of thickness was compared to experiment. ⺠Interfacial sharpness changes in a complicated manner with thickness. ⺠The Moison diffusion model gave the closest match to experiment.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Paul D. Robb, Michael Finnie, Alan J. Craven,