| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677560 | Ultramicroscopy | 2012 | 13 Pages |
Abstract
⺠We present results a hole-free phase plate (HFPP) method for phase imaging in TEM. ⺠The HFPP offers up to 3à decrease in irradiation dose compared to bright field TEM. ⺠The incident beam itself defines the HFPP center, mechanical alignment is not needed. ⺠Film bias due to secondary electron emission is the likely origin of HFPP contrast.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Marek Malac, Marco Beleggia, Masahiro Kawasaki, Peng Li, Ray F. Egerton,