Article ID Journal Published Year Pages File Type
1677588 Ultramicroscopy 2013 7 Pages PDF
Abstract
► Quantitative approach is developed to accurately reconstruct APT data. ► Curvature of atomic planes in APT data is used to calibrate the reconstruction. ► APT reconstruction parameters are determined from a single crystallographic axis. ► Quantitative approach is demonstrated on W, Al and Al-Mg-Sc systems. ► Accurate APT reconstruction of complex materials is now possible.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
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