Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1677588 | Ultramicroscopy | 2013 | 7 Pages |
Abstract
⺠Quantitative approach is developed to accurately reconstruct APT data. ⺠Curvature of atomic planes in APT data is used to calibrate the reconstruction. ⺠APT reconstruction parameters are determined from a single crystallographic axis. ⺠Quantitative approach is demonstrated on W, Al and Al-Mg-Sc systems. ⺠Accurate APT reconstruction of complex materials is now possible.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Santosh K. Suram, Krishna Rajan,