| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677591 | Ultramicroscopy | 2013 | 6 Pages |
Abstract
⺠New data treatment methods allow delineation of grain boundaries, even without segregation. ⺠Proxigrams calculated from the surfaces accurately show the extent of segregation. ⺠Tessellation of the data volume can be used to map the Gibbsian interfacial excess.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S.K. Samudrala, P.J. Felfer, V.J. Araullo-Peters, Y. Cao, X.Z. Liao, J.M. Cairney,