Article ID Journal Published Year Pages File Type
1677643 Ultramicroscopy 2012 8 Pages PDF
Abstract
► Model developed to simulate TRIF imaging in AFM for both passive and active probes. ► Topography errors occur due to elasticity and adhesion variations with RMS control. ► Peak force control eliminates adhesion based errors, but elasticity errors remain. ► Minimal repulsive force is required to eliminate elasticity based errors. ► Active tip control minimizes errors, preserves stability and material information.
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Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
Analysis of time-resolved interaction force mode AFM imaging using active and passive probes
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