Article ID Journal Published Year Pages File Type
1677700 Ultramicroscopy 2012 10 Pages PDF
Abstract

A novel generalized linear transfer theory describing the signal and noise transfer in image detectors has been developed in Part I (Niermann, this issue, [1]) of this paper. Similar to the existing notion of a point spread function (PSF) describing the transfer of the first statistical moment (the average), a noise spread function (NSF) was introduced to characterize the spatially resolved transfer of noise (central second moment, covariance). Following the theoretic results developed in Part I (Niermann, this issue, [1]), a new experimental method based on single spot illumination has been developed and applied to measure 2D point and 4D noise spread functions of CCD cameras used in TEM. A dedicated oversampling method has been used to suppress aliasing in the measured quantities. We analyze the 4D noise spread with respect to electronic and photonic noise contributions.

► We present a new detector characterization method based on single spot illumination. ► Highly accurate MTFs comparable to the knife-edge method are determined. ► 4D noise spread functions have been successfully measured for the first time.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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