| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677715 | Ultramicroscopy | 2013 | 14 Pages |
Abstract
⺠ACOM-STEM is combined with in situ straining for thin film mechanical testing. ⺠Direct observation of structural changes in micro- and macroplastic regime. ⺠The local and global grain rotation, grain growth and twinning are quantified.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Kobler, A. Kashiwar, H. Hahn, C. Kübel,