| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677755 | Ultramicroscopy | 2012 | 6 Pages |
Abstract
⺠Proposed a quantitative x-ray phase imaging method using XOR-based DIC microscopy. ⺠Implemented bias retardation by shifting the grating with respect to the zone-plate. ⺠A nonlinear regression algorithm is used to extract the object's phase distribution. ⺠Both quantitative phase reconstruction and qualitative DIC imaging are demonstrated.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Takashi Nakamura, Chang Chang,