| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677757 | Ultramicroscopy | 2012 | 6 Pages |
Abstract
⺠The article describes methods how to prepare, characterize and clean ultrasharp tungsten tips. ⺠A novel method for estimating the tip radius based on a single measurement of autoemission current is described. ⺠MCFRW (Monte Carlo Floating Random Walk) method is used to calculate an electric field in proximity of the tip apex. ⺠The most frequently used tip cleaning procedures are investigated. ⺠Effectiveness and optimal cleaning conditions are discussed for each of the methods.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. SetvÃn, J. Javorský, D. TurÄinková, I. MatolÃnová, P. SobotÃk, P. Kocán, I. OÅ¡t'ádal,