TEM preparation method for site- and orientation-specific sectioning of individual anisotropic nanoparticles based on shadow-FIB geometry

For the comprehensive characterization of nanoparticles cross-sectional investigation on the atomic scale by analytical and high-resolution transmission electron microscopy (TEM) is indispensable. Cross-sectioning is especially important for anisotropic nanoparticles to gain information on structure and chemistry along all important projections. We present a focused ion beam (FIB) method for site- and orientation-specific cross-sectioning of arbitrary nanoparticles that are dispersed on a substrate. By adopting a shadow geometry originally developed for thin sensitive films' protection of the specimen by a platinum layer is avoided. This enables simultaneous observation (from the front side) by the electron beam and ion-beam sectioning (from the back side of the supporting substrate) of individually selected particles with excellent accuracy on the nanometer scale. The feasibility and general applicability of the method is demonstrated by site-specific sectioning and cross-section HRTEM investigation of two types of anisotropic nanostructures: silver nanorods with five-fold twin structure and Janus-type silver patchy particles.

► TEM preparation method for cross-sectioning of individual anisotropic nanoparticles. ► Method applicable to all types of nanoparticles that can be dispersed on a substrate. ► Shadow-FIB geometry enables simultaneous observation and ion beam sectioning. ► Feasibility of the method demonstrated for Ag nanowires and patchy particles. ► HRTEM analyses provide insight into internal defect structures and interfaces.