| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677787 | Ultramicroscopy | 2011 | 4 Pages |
Frank's observation that a TEM bright-field image acquired under non-stationary conditions can be modeled by the time integral of the standard TEM image model [J. Frank, Nachweis von objektbewegungen im lichtoptis- chen diffraktogramm von elektronenmikroskopischen auf- nahmen, Optik 30 (2) (1969) 171–180.] is re-derived here using counting statistics based on Poisson's binomial distribution. The approach yields a statistical image model that is suitable for image analysis and simulation.
► TEM images acquired under nonstationary conditions modeled using counting statistics. ► Poisson's Binomial distribution models counting process associated with TEM images. ► Resulting statistical image model generalizes existing ones based on Poisson models. ► The resulting statistical model useful for analysis and simulation of TEM images.
