| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677804 | Ultramicroscopy | 2010 | 6 Pages |
Abstract
We report on the design and first tests of a novel instrument aimed at combining the benefits of scanning force microscopy with those of X-ray spectroscopy. For this we built an instrument combining a scanning transmission X-ray microscope with a beam-deflection atomic force microscope in a coaxial geometry. This allows to combine X-ray absorption spectroscopy and high resolution topography in-situ. When replacing the conventional scanning probe tip by a coaxially shielded tip the instrument will allow detection of the photoelectrons produced by resonant X-ray absorption. This could yield spectroscopic information with a spatial resolution approaching the values achievable with atomic force microscopy.
Related Topics
Physical Sciences and Engineering
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Nanotechnology
Authors
I. Schmid, J. Raabe, B. Sarafimov, C. Quitmann, S. Vranjkovic, Y. Pellmont, H.J. Hug,