Article ID Journal Published Year Pages File Type
1677812 Ultramicroscopy 2010 4 Pages PDF
Abstract

In this paper we present a method for measurement of rigid body expansion at near-CSL grain boundaries, which treats secondary grain boundary dislocations explicitly. This method makes use of high resolution electron microscopy images. As a case study, a strontium titanate (SrTiO3) near-Σ3(112)[1¯10] grain boundary has been characterized. The Frank circuit method is used to characterize the Burgers vector of the dislocation as b = (a0/6)[1 1 2] (where a0 = 3.905 Å is the SrTiO3 lattice parameter). Using the proposed method for expansion measurement, the rigid body expansion at the boundary is measured to be (0.07×0.05) Å. This result is compared to theoretically predicted grain boundary expansion and is found to be in better agreement with one of the two model structures proposed in the literature.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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