| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677821 | Ultramicroscopy | 2012 | 5 Pages |
Abstract
⺠Automatic analysis of selected area diffraction pattern. ⺠Application of cross-correlation in diffraction pattern analysis. ⺠Software package outputs d-spacing and interplaner angles.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
C.H. Wu, W.T. Jr., M. Murayama,