| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677840 | Ultramicroscopy | 2012 | 6 Pages |
Abstract
⺠Improvement in atomic force microscopy in buffer solution. ⺠Peak force detection. ⺠Subtracting the cantilever dragging force. ⺠Forces in the 100 pN range. ⺠Imaging of delicate viruses with atomic force microscopy.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Ortega-Esteban, I. Horcas, M. Hernando-Pérez, P. Ares, A.J. Pérez-Berná, C. San MartÃn, J.L. Carrascosa, P.J. de Pablo, J. Gómez-Herrero,