| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677887 | Ultramicroscopy | 2011 | 11 Pages |
Abstract
⺠We have simulated HREM images incorporating fully bonded DFT charge density. ⺠Bonding electrons contribute up to 25% of total image contrast. ⺠Dynamical amplification increases bond contrast for thick (>20 nm) crystals. ⺠Bonding contrast limited by signal/noise, not resolution (Cs corrector unnecessary).
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J. Ciston, J.S. Kim, S.J. Haigh, A.I. Kirkland, L.D. Marks,