| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1677889 | Ultramicroscopy | 2011 | 20 Pages |
Abstract
⺠Algorithms for the highly precise diffractogram analysis in HRTEM are introduced. ⺠AMADEUS procedure measures defocus and astigmatism with a few Angstrom precision. ⺠Aberration measurement meets the precision requirements of 0.5 Ã
microscopy. ⺠Quantitative criteria for the optical stability of HRTEMs are introduced.
Related Topics
Physical Sciences and Engineering
Materials Science
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Authors
J. Barthel, A. Thust,