Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1677903 | Ultramicroscopy | 2011 | 14 Pages |
Abstract
⺠We present an algorithm for grain reconstruction from 2d and 3d EBSD data. ⺠The algorithm allows for any measurement geometries and missing data. ⺠The algorithm does not introduce any bias towards certain phases. ⺠The algorithm does not require any interpolation of orientation measurements. ⺠The algorithm is implemented into the free texture analysis software MTEX.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Florian Bachmann, Ralf Hielscher, Helmut Schaeben,