Article ID Journal Published Year Pages File Type
1678007 Ultramicroscopy 2011 4 Pages PDF
Abstract

The next generations of advanced energy systems will require materials that can withstand high doses of irradiation at elevated temperatures. Therefore, a methodology has been developed for the fabrication of high-dose ion-irradiated atom probe tomography specimens at a specific dose with the use of a focused ion beam milling system. The method also enables the precise ion dose of the atom probe tomography specimen to be estimated from the local concentration of the implanted ions. The method has been successfully applied to the characterization of the distribution of nanoclusters in a radiation-tolerant 14YWT nanostructured ferritic steel under ion irradiation to doses up to 400 displacements per atom.

Research highlights► Method developed for fabricating high-dose APT specimens at specific dose. ► Combination of SRIM and SIMS calibrations ensure an accurate dose. ► Method evaluated with nanostructured steels ion irradiated up to 460 dpa.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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