| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678028 | Ultramicroscopy | 2011 | 6 Pages |
Abstract
âºWe develop an applicable method to prepare TEM specimens from thin ceramic fibers. âºWe develop novel embedding processes to enhance the polishing efficiency. âºA self-manufactured device is used to get uniformly low thickness. âºOne-side dimpling method and calculated ion milling process are introduced. âºSamples with large thin area for longitudinal and cross-sectional view are obtained.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Siwei Li, Zude Feng, Litong Zhang, Yanyan Wang, Lifu Chen,