| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678033 | Ultramicroscopy | 2011 | 4 Pages |
Abstract
âºWe present a robust method to determine Young's modulus of nanowires/nanotubes via quasi-static deflection by Lorentz forces. âºThe results indicate a significant influence of the fixation point on the final result (factor 1.6). âºWe present a model, which incorporates the influence of fixation points as well as (partial) coatings on the nanostructure under investigation. âºThe use of a transmission electron microscope and the in situ experimentation allows for the simultaneous investigation of mechanical and electrical properties.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. Löffler, U. Weissker, T. Mühl, T. Gemming, B. Büchner,