Article ID Journal Published Year Pages File Type
1678034 Ultramicroscopy 2011 10 Pages PDF
Abstract

Transmission electron microscopy phase-contrast images taken by amorphous carbon film-based phase plates are affected by the scattering of electrons within the carbon film causing a modification of the image-wave function. Moreover, image artefacts are produced by non-centrosymmetric phase plate designs such as the Hilbert-phase plate. Various methods are presented to correct phase-contrast images with respect to the scattering of electrons and image artefacts induced by phase plates. The proposed techniques are not restricted to weak-phase objects and linear image formation. Phase-contrast images corrected by the presented methods correspond to those taken by an ideal centrosymmetric, matter-free phase plate and are suitable for object-wave reconstruction.

Research Highlights► Object-wave reconstruction by phase plates considering nonlinear image formation. ► Requirement of three (five) images in case of Zernike- (Hilbert-) phase plates. ► Analytical correction of damping and/or image artefacts induced by phase plates.► Validation by simulation of crystalline silicon.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
, , , , , ,