Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678192 | Ultramicroscopy | 2010 | 7 Pages |
Abstract
Principal component analysis is routinely applied to analyze data sets in electron energy-loss spectroscopy (EELS). We show how physically meaningful spectra can be obtained from the principal components using a knowledge of the scattering of the probe electron and the geometry of the experiment. This approach is illustrated by application to EELS data for the carbon K edge in graphite obtained using a conventional transmission electron microscope. The effect of scattering of the probe electron is accounted for, yielding spectra which are equivalent to experiments using linearly polarized X-rays. The approach is general and can also be applied to EELS in the context of scanning transmission electron microscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
C. Witte, N.J. Zaluzec, L.J. Allen,