| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678215 | Ultramicroscopy | 2010 | 10 Pages |
Abstract
In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary objects provided the coordinates of all the atoms can be supplied.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Gómez-Rodríguez, L.M. Beltrán-del-Río, R. Herrera-Becerra,