Spin polarization of field-emitted electrons from half-metallic Co2MnSi thin films grown on a W(0 0 1) facet

We measured spin polarization of electrons field-emitted from half-metallic Co2MnSi thin film grown on a W(0 0 1) facet via chromium buffer layer using Mott scattering. For spontaneously magnetized samples, values of polarization at room temperature were observed in a range from 10% to 46% and the polarization direction was 〈1 1 0〉 orientation of substrate tungsten, which agreed with an easy axis of magnetization of bulky Co2MnSi. An enhancement of polarization was observed as a consequence of applying a magnetic field of 350 G perpendicular to the emitter axis after the annealing at 800 K. This result is considered to be caused by improvement in crystallinity of the evaporated film due to annealing.