Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678242 | Ultramicroscopy | 2009 | 4 Pages |
Abstract
We measured spin polarization of electrons field-emitted from half-metallic Co2MnSi thin film grown on a W(0 0 1) facet via chromium buffer layer using Mott scattering. For spontaneously magnetized samples, values of polarization at room temperature were observed in a range from 10% to 46% and the polarization direction was 〈1 1 0〉 orientation of substrate tungsten, which agreed with an easy axis of magnetization of bulky Co2MnSi. An enhancement of polarization was observed as a consequence of applying a magnetic field of 350 G perpendicular to the emitter axis after the annealing at 800 K. This result is considered to be caused by improvement in crystallinity of the evaporated film due to annealing.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Shigekazu Nagai, Yuji Fujiwara, Koichi Hata,