| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678245 | Ultramicroscopy | 2009 | 5 Pages |
Abstract
High detection efficiency combined with spatial resolution on a nm-scale makes the field ionization process a promising candidate for spatially resolved neutral particles detection. The effective cross-sectional area Ïeff can serve as a measure for the effectiveness of such a field ion detector. In the present contribution, we combine quantum-mechanical calculations of the field-modified electron density distribution near the tungsten tip surface and of the resulting local field distributions, performed using the functional integration method, with a classical treatment of the atom trajectories approaching the tip in order to calculate the Ïeff values for ionization of free He atoms over an apex of a tungsten field emitter tip. The calculated values are compared with experimental data for supersonic He atomic beams at two different temperatures 95 and 298Â K.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
B. Holst, J. Piskur, P.P. Kostrobiy, B.M. Markovych, Y. Suchorski,
