| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678276 | Ultramicroscopy | 2009 | 7 Pages |
Abstract
Additionally, structural information could be gained employing transmission electron microscopy and diffraction measurements.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Catharina Wille, Taláat Al-Kassab, Pyuck-Pa Choi, Young-Soon Kwon, Reiner Kirchheim,