Article ID Journal Published Year Pages File Type
1678297 Ultramicroscopy 2009 5 Pages PDF
Abstract

We discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation of interface energy-loss modes. We also demonstrate the use of a Bayesian-equivalent procedure based on the Richardson–Lucy algorithm.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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