Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678297 | Ultramicroscopy | 2009 | 5 Pages |
Abstract
We discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation of interface energy-loss modes. We also demonstrate the use of a Bayesian-equivalent procedure based on the Richardson–Lucy algorithm.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Feng Wang, Ray Egerton, Marek Malac,