Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678310 | Ultramicroscopy | 2010 | 4 Pages |
Abstract
The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Anna-Clare Milazzo, Grigore Moldovan, Jason Lanman, Liang Jin, James C. Bouwer, Stuart Klienfelder, Steven T. Peltier, Mark H. Ellisman, Angus I. Kirkland, Nguyen-Huu Xuong,