Interference electron microscopy of one-dimensional electron-optical phase objects

The application of interference electron microscopy to the investigation of electron optical one-dimensional phase objects like reverse biased p–n junctions and ferromagnetic domain walls is considered. In particular the influence of diffraction from the biprism edges on the interference images is analyzed and the range of applicability of the geometric optical equation for the interpretation of the interference fringe shifts assessed by comparing geometric optical images with full wave-optical simulations. Finally, the inclusion of partial spatial coherence effects are discussed.