| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678626 | Ultramicroscopy | 2007 | 7 Pages |
Abstract
Inhomogeneities in semiconductor solids can be imaged by two-dimensional mapping of the amplitude of periodically modulated tip current in scanning tunneling microscopy that is induced by illumination of semiconductor samples with a chopped light. It has been shown that it is possible to distinguish between plural origins of the photo-modulated current by analyzing the response properties of the current signal. A judicial choice of the modulation frequency is important for the required contrasts to be obtained.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Nobuyasu Naruse, Yutaka Mera, Yukinobu Hayashida, Koji Maeda,