| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678642 | Ultramicroscopy | 2007 | 5 Pages |
Abstract
A new method for the determination of the crystallographic indices of planar fracture surfaces is described. The key innovation is the use of a focused ion beam instrument to extract two transmission electron microscopy (TEM) foils from the fracture surface. Selected area diffraction of these foils in the TEM allows the determination of the fracture plane from the cross product of two crystallographic line directions contained within the plane. This allows the indices to be determined from relatively small fracture surfaces, affording fracture plane determinations from facets on polycrystalline samples. The validation of this method using cleavage fracture in pure zinc is described.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Robert E. Hackenberg, Robert D. Field, Pallas A. Papin, Jason C. Cooley, David F. Teter,