Article ID Journal Published Year Pages File Type
1678660 Ultramicroscopy 2008 13 Pages PDF
Abstract

The optimal lens parameters for incoherent imaging using third and fifth-order aberration-corrected electron microscopes are derived analytically. We propose simple models for the point spread function (PSF) and transfer function that give analytic formulae for the lateral resolution and depth resolution. We also derive an analytic formula for the contrast transfer function (CTF) in three dimensions and show that depth sectioning has an information limit equivalent to tomography with a missing cone of 90∘90∘ minus the aperture angle.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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