Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678661 | Ultramicroscopy | 2008 | 9 Pages |
Abstract
Aberrations up to the fifth-order were successfully measured using an autocorrelation function of the segmental areas of a Ronchigram. The method applied to aberration measurement in a newly developed 300 kV microscope that is equipped with a spherical aberration corrector for probe-forming systems. The experimental Ronchigram agreed well with the simulated Ronchigram that was calculated by using the measured aberrations. The Ronchigram had an infinite magnification area with a half-angle of 50 mrad, corresponding to the convergence angle of a uniform phase.
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Authors
H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi,