Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678720 | Ultramicroscopy | 2006 | 6 Pages |
Abstract
Next generation aberration correctors will not only eliminate the third-order spherical aberration, but also improve the information limit by correction of chromatic aberration. As a result of these improvements, higher order aberrations, which have largely been neglected in image analysis, will become important. In this paper, we concern ourselves with situations where sub-Ã
 resolution can be achieved, and where the third-order spherical aberration is corrected and the fifth-order spherical aberration is measurable. We derive formulae to explore the maximum value of the fifth-order spherical aberration for directly interpretable imaging and discuss the optimum imaging conditions and their applicable range.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
L.Y. Chang, A.I. Kirkland, J.M. Titchmarsh,