Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1678761 | Ultramicroscopy | 2009 | 10 Pages |
Abstract
Different deconvolution methods for removing multiple scattering and instrumental broadening from core loss electron energy loss spectra are compared with special attention to the artefacts they introduce. The Gaussian modifier method, Wiener filter, maximum entropy, and model based methods are described. Their performance is compared on virtual spectra where the true single scattering distribution is known. A test on experimental spectra confirms the good performance of model based deconvolution in comparison to maximum entropy methods and shows the advantage of knowing the estimated error bars from a single spectrum acquisition.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J. Verbeeck, G. Bertoni,