| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678791 | Ultramicroscopy | 2009 | 8 Pages |
Abstract
A software tool, named as HANSIS (HOLZ analysis), has been developed for the automated analysis of higher-order Laue zone (HOLZ) lines in convergent beam electron diffraction (CBED) patterns. With this tool, the angles and distances between the HOLZ intersections can be measured and the data can be presented graphically with a user-friendly interface. It is capable of simultaneous analysis of several HOLZ patterns and thus provides a tool for systematic studies of CBED patterns.
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Authors
D. Holec, D.V. Sridhara Rao, C.J. Humphreys,