Article ID Journal Published Year Pages File Type
1678848 Ultramicroscopy 2009 10 Pages PDF
Abstract

The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈001〉SrTiO3SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.

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Physical Sciences and Engineering Materials Science Nanotechnology
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