| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1678853 | Ultramicroscopy | 2009 | 5 Pages |
Abstract
Scanning probe imaging in a shear force mode allows for the characterization of in-plane surface properties. In a standard AFM, shear force imaging can be realized by the torsional resonance mode. In order to investigate the imaging conditions on mineral surfaces, a torsional resonance mode atomic force microscope was operated in amplitude (AM) and frequency modulation (FM) feedback. Freshly cleaved chlorite was investigated, which showed brucite-like and talc-like surface areas. In constant amplitude FM mode, a slight variation in energy dissipation was observed between both surfaces. Amplitude and frequency vs. distance curves revealed that the tip was in repulsive contact with the specimen during imaging.
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Physical Sciences and Engineering
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Authors
Ayhan Yurtsever, Alexander M. Gigler, Robert W. Stark,